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TLP115A TOSHIBA Photocoupler GaAAs Ired & Photo-IC TLP115A High Speed, Long Distance Isolated Line Receiver Microprocessor System Interfaces Digital Isolation For A / D, D / A Conversion Computer-Peripheral Interfaces Ground Loop Elimination The TOSHIBA mini flat coupler TLP115A is a small outline coupler, suitable for surface mount assembly. TLP115A consists of a high output power GaAAs light emitting diode, optically coupled to an integrated high gain, high speed shielded photo detector whose output is an open collector schottky clamped transistor. The shield, which shunts capacirively coupled common noise to ground, provides a guaranteed transient immunity specification of 1000V / s. Input current thresholds: IF = 5mA (max.) Switching speed: 10MBd (typ.) Common mode transient immunity: 1000V / s (min.) Guaranteed performance over temp. : 0~70C Isolation voltage: 2500Vrms (min.) UL recognized: UL1577, file no. E67349 TOSHIBA Weight: 0.09g 11-4C2 Unit in mm Pin Configuration (top view) 1 VCC 6 5 Schematic ICC 1 IO VF 5 VO VCC 6 1 : Anode 3 : Cathode 4 : GND 5 : VO(Output) 6 : VCC 3 GND 4 GND 3 Shield 4 Truth Table (positive logic) Input H L Output L H Note. A 0.1F bypass capacitor must be connected between pins 4 and 6. 1 2007-10-01 TLP115A Absolute Maximum Ratings (Ta = 25C) Characteristic Forward current LED Pulse forward current Peak transient forward current Reverse voltage Output current Detector Output voltage Supply voltage(1 minute maximum) Output power dissipation Operating temperature range Storage temperature range Lead solder temperature(10 sec.) Isolation voltage(AC, 1 min., RH 60%, Note 4) (Note 1) (Note 2) (Note 3) Symbol IF IFP IFPT VR IO VO VCC Po Topr Tstg Tsol BVS Rating 20 40 1 5 25 7 7 40 -40~85 -55~125 260 2500 Unit mA mA A V mA V V mW C C C Vrms Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc). (Note 1) Derate 0.36mA / C above 70C. (Note 2) 50% duty cycle, 1ms pulse width. Derate 0.72mA / C above 70C. (Note 3) Pulse width 1s, 300pps. Recommended Operating Conditions Characteristic Input voltage, low level Input current, high level Supply voltage Fan out (TTL load, each channel) Operating temperature Symbol VFL IFH VCC N Topr Min. -3 6.3 4.5 0 Typ. 0 8 5 Max. 1.0 20 5.5 8 70 Unit V mA V C Note: Recommended operating conditions are given as a design guideline to obtain expected performance of the device. Additionally, each item is an independent guideline respectively. In developing designs using this product, please confirm specified characteristics shown in this document. 2 2007-10-01 TLP115A VFL 1.0V) Electrical Characteristics (unless otherwise specified, Ta = 0~70C, VCC = 4.5 ~ 5.5V, Characteristic Forward voltage Forward voltage temperature coefficient Reverse current Capacitance between terminals High level output voltage Low level output current "H level outputL level output" input current High level supply current Low level supply current Input-output insulation leakage current Isolation resistance Stray capacitance between input to output Symbol VF VF / Ta IR CT IOH VOL IFH ICCH ICCL IS RS CS Test Condition IF = 10mA, Ta =25C IF = 10mA VR = 3V, Ta = 25C VF = 0, f = 1MHz, Ta = 25C VF = 1.0, VO = 5.5V VF = 1.0, VO = 5.5V, Ta = 25C IF = 5mA IOL = 13mA (sinking) IOL = 13mA (sinking) VOL = 0.6V VCC = 5.5V, IF = 0 VCC = 5.5V, IF = 10mA VS = 3540V, t = 5s Ta = 25C (Note 4) Min. 1.2 5x10 10 Typ. 1.4 -2 30 0.5 0.4 7 12 10 14 Max. 1.7 10 250 10 0.6 5 15 19 100 Unit V mV / C A PF A V mA mA mA A PF R.H. 60%, VS = 500V DC Ta = 25C (Note 4) VS = 0, f = 1MHz Ta = 25C (Note 4) 0.8 * All typical values are VCC = 5V, Ta = 25C. 3 2007-10-01 TLP115A Switching Characteristics (VCC = 5V, Ta = 25C) Characteristic Propagation delay time (HL) Propagation delay time (LH) Output rise fall time(10-90%) Common mode transient immunity at high output level Common mode transient immunity at low output level Symbol tpHL tpLH tr , tf Test Circuit 1 1 2 Test Condition IF = 07.5mA CL = 15pF, RL = 350 IF = 7.50mA CL = 15pF, RL = 350 RL = 350, CL = 15pF IF = 07.5mA IF = 0 mA, CMH 2 VCM = 400Vp-p, VO(MIN)=2V RL = 350 IF = 7.5 mA, VCM = 400Vp-p CML 2 VO(MAX) = 0.8V, RL = 350 -1000 V / s 1000 V / s Min. Typ. 60 60 30 Max. 120 120 Unit ns ns ns (Note 4) Device considered a two-terminal device: Pins 1 and 3 shorted together, and pins 4, 5 and 6 shorted together. (Note 5) The VCC supply voltage to each TLP115A isolator must be bypassed by 0.1F capacitor. This can be either a ceramic or solid tantalum capacitor with good high frequency characteristic and should be connected as close as possible to package VCC and GND pins of each device. (Note 6) Maximum electrostatic discharge voltage for any pins: 180V(C = 200pF, R = 0) 4 2007-10-01 TLP115A Test Circuit 1: Switching Time Test Circuit IF Pulse input PW = 100s Duty ratio = 1 / 10 IF monitor 100 VCC = 5V 0.1F 350 VCC IF VC tf tr 7.5mA 3.75mA 0mA 5V 4.5V CL GND Output monitor VO tpHL tpLH 1.5V 0.5V VOL CL is approximately 15pF which includes probe and stray wiring capacitance. Test Circuit 2: Common Mode Transient Immunity Test Circuit IF VCC VCC = 5V 90% 10% VO Output monitor VO (IF = 0mA) tr tf 400V 0.1F 350 VCM 0V CL GND VCM Pulse generator ZO = 50 5V 2V 0.8V VO (IF = 10mA) VOL CMH = 320 (V) 320 (V) , CML = tr (s) t f (s) CL is approximately 15pF which includes probe and stray wiring capacitance. 5 2007-10-01 TLP115A IF - V F Forward voltage temperature coefficient VF / a (mV / C ) 100 -4.0 -3.6 -3.2 -2.8 -2.4 -2.0 -1.6 -1.2 0.1 0.3 0.5 VF / a - IF (mA) Ta = 70C 10 0C 25C Forward current IF 1 0.1 0.01 1.0 1.2 1.4 1.6 1.8 2.0 1 3 5 10 30 Forward voltage VF (V) Forward current IF (mA) VO - IF 8 VCC = 5V Ta = 25C 10 5 IOH - Ta VF = 1V VCC = 5.5V VO = 5.5V (V) High level output current IOH (A) 4 6 3 VO Output voltage RL = 350 4 RL = 1k RL = 4k 2 1 0.5 0.3 0.1 0 0 0.05 5 6 - 20 0 1 2 3 20 40 60 80 Forward current IF (mA) Ambient temperature Ta (C) VO - IF 8 VCC = 5V VO L - Ta RL = 350 IF = 5mA 0.5 VCC = 5.5V VE = 2V IOL = 16mA 0.4 12.8 9.6 6.4 0.3 (V) RL = 4k 6 VO Output voltage Ta = 70C 4 Ta = 0C 2 Low level output voltage VOL (V) 0 0 1 2 3 4 5 6 0.2 0 20 40 60 80 Forward current IF (mA) Ambient temperature Ta (C) 6 2007-10-01 TLP115A tpHL , tpLH - IF 120 300 RL = 4k tpHL, tpLH - Ta (ns) (ns) RL = 4k 260 IF = 16mA 220 VCC = 5V tpHL, tpLH 100 tpHL, tpLH 80 1k Propagation delay time Propagation delay time 350 60 120 RL = 350 1k 4k tf tr 1k 80 40 RL = 350 1k 4k Ta = 25C VCC = 5V 40 350 tpHL tpLH 20 20 10 0 12 14 16 18 - 20 0 20 40 60 80 Forward current IF (mA) Ambient temperature Ta (C) tr, tf - Ta 120 RL = 4k 100 (ns) 80 1k 350 tr, tf Rise fall time 60 40 RL = 350 1k 4k IF = 16mA VCC = 5V 20 tpHL tpLH 80 0 - 20 0 20 40 60 Ambient temperature Ta (C) 7 2007-10-01 TLP115A RESTRICTIONS ON PRODUCT USE * The information contained herein is subject to change without notice. 20070701-EN * TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer's own risk. * The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. * GaAs(Gallium Arsenide) is used in this product. The dust or vapor is harmful to the human body. Do not break, cut, crush or dissolve chemically. * Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 8 2007-10-01 |
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